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Reworkability of Underfill Materials (for CGA)

Reworkability of Underfill Materials
NEPP Deliverable
Jong Kadesch
Harry Shaw
10/10/01

 

Outline
• Objective
• Procurement
– underfill material, and two rigid boards (one with pins, and one
without pins)
• Assembly Process
– Mate two rigid boards using conductive epoxy
– Column Grid Array (CGA) interconnection
– Fill with underfill around CGA interface
• Test Plan
– temperature cycles
– Destructive Physical Analysis (DPA)
• Removal Method Experiment

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